Research Consultancy

Research Facilities

  • o   X-ray Diffractometer
  • o   Fourier Transform Infrared Spectrometer
  • o   UV-Vis-NIR Spectrophotometer

X-ray Diffractometer

X-Ray Powder Diffractometer (XRD) is one of the most powerful and established technique for material structural analysis, capable of providing information about the structure of a material at the atomic level. It is a high-tech, non-destructive technique for analyzing a wide range of materials, including metals, minerals, polymers, catalysts, plastics, biological materials, pharmaceuticals, thin- film coatings, ceramics, crystals and semiconductors. XRD is the most wanted tool for industry and research institutes especially for material investigation, characterization and quality control.

Fourier Transform Infrared Spectrometer

Fourier Transform Infrared Spectroscopy- Attenuated Total Reflection (FTIR-ATR), is a versatile and powerful technique for structural characterization of organic and inorganic molecules in solids, liquids and gaseous forms. It is a powerful tool for identifying types of chemical bonds in a molecule by producing an infrared absorption spectrum that is like a molecular fingerprint. Infrared spectrum is useful in identifying the functional groups like -OH, -CN, -CO, -CH, -NH2, etc. It can be used for both qualitative and quantitative studies.

UV-Vis-NIR Spectrophotometer

UV-Vis-NIR Spectrophotometery is a method to measure how much a chemical substance absorbs light, by measuring the intensity of light as a beam of light passes through sample. The optical absorption by samples in the ultraviolet, visible and near infrared regions are measured with this instrument. This instrument is used for absorption and transmittance measurement of solution and solid samples. The Integrating Sphere (ISR) attachment provides diffused reflectance spectra of solid samples, such as powders, papers and cloths, even up to 1400 nm